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8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

Phidix Motion Controls (Shanghai) Co., Ltd.
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8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

Brand Name : Phidix

Model Number : M22003

Certification : IATF16949,CE

Place of Origin : China

MOQ : Negotiable

Price : Negotiable

Payment Terms : L/C, D/A, D/P, T/T, Western Union

Supply Ability : 10 PCS/Month

Delivery Time : 40 Work Days

Packaging Details : 1 PC/Wooden Box

Color : White

Customization : OEM, ODM

Packing : 1 PC/Carton

Warranty : 1 year

Lead-time : 40 Work Days

Resolution : 3nm, 6nm

Magnification : 300,000X

Accelerating Voltage : 0~30kV

Signal Detection : CCD High Vacuum Secondary Electron Detector

Electron Gun : Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge/LaB6(Option)

Max Sample size : 175mm in diameter, 35mm in height

Auto Function : Gun Heating,Bias,Centering,Focus,Bright,Contrast,Stigmator, Autocorrection,Fault Detection

Vacuum system : 1TMP, 1RP

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Magnification 8X-300,000X Scanning Electron Microscope 3-6nm Resolution with Optional EBSD EBSD

M22003 electron microscope operating software can be switched in Chinese/English with modular layout. In addition to the basic operation function of electron microscope, it also has one-click image viewing. This series software supports simultaneous display of three real-time images, two channels with CCD window, and powerful auxiliary functions such as synthesis of secondary electron image and backscattered image, multi-point size measurement, text annotation of electron microscope pictures, vacuum map display, CCD window display, etc., to meet the individual needs of different users.

Automatic functions: focusing, brightness/contrast adjustment, astigmatism, electron beam centering, automatic correction of electron gun, fault detection, one-button viewing, optional 3D reconstruction, etc.

Saved pictures: 4096x4096pixel BMP, GIF, TIF, JPG, MNG, ICO SEM.

Specials:

- Magnification Max 300,000X.

- Signal Detection: CCD High Vacuum Secondary Electron Detector( With detector perotection function) , Semiconductor Four Segemation Back Scattering Electron Detector, CCD Montioring Camera.

- Accelerating Voltage: 0~30KV, High image resolution.

- EDS/EBSD/CL is optional, for component analysis.

- High Vacuum System.

- Four Axes Motorized Stage.

Item Specification M22003A M22003B
Resolution 3nm@30kV(SE)
6nm@30kV(BSE)
Magnification 8X~300,000X, Displayed Magnification:Magnification is defined with a display size 127mm*211mm
Accelerating Voltage 0~30kV

Signal Detection

CCD High Vacuum Secondary Electron Detector( With detector perotection function)

Semiconductor Four Segemation Back Scattering Electron Detector

CCD Montioring Camera

Electron Gun Tungsten Heated Cathode-Pre Centered Tungsten Filament Cartridge/LaB6(Option)
Auto Function Gun Heating,Bias,Centering,Focus,Bright,Contrast,Stigmator, Autocorrection,Fault Detection
StageSystem/Movement Four Axes Motorized Stage
X: 0~70mm, Auto
Y: 0~50mm, Auto
Z: 0~45mm, Auto
R: 360°, Auto
T: -5°~90°, Manual
Max Sample Diameter 175mm
Max Sample Height 35mm
Vacuum system 1 TMP,1RP (Turbomolecular pump, mechanical pump)
Low vacuum atmosphere (10-270Pa)
Optional Detector EDSEBSDCL
Optional Accessories EBLCryo&Heating StageNano ManipulatorTensile Stage

Note: ● means standard, ○ means optional

Gallery

8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

Image Processing Software

8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD

8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD


Product Tags:

8X-300 000X Scanning Electron Microscope

      

3-6nm Resolution Scanning Electron Microscope

      

c scanning transmission electron microscope

      
China 8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD wholesale

8X-300,000X Scanning Electron Microscope 3-6nm Resolution EBSD EBSD Images

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